M. Sonza Reorda

· Politecnico di Torino
44h 指数
9,591总引用
753发文
240i10

简介

AI 合成简介
[Synthesized from ORCID profile metadata] Research keywords: Test, Reliability, Fault tolerance, PE7_4 - (Micro and nano) systems engineering, automatic test equipment, collaudo, reliability analysis, circuit reliability, circuit faults, automatic test pattern generation, PE6_2 - Computer systems, parallel/distributed systems, sensor networks, embedded systems, cyber-physical systems Profiles: Scopus Author ID: 57188717230 (self); ResearcherID: J-1775-2018 (self); SciProfiles: 1135537 (self)

ℹ️ 本简介由 AI 根据教授关键词/学科资料合成, 非 ORCID 自填简介。如需准确信息, 请查阅 ORCID 官方档案或联系所属机构获取 CV。

研究方向

VLSI and Analog Circuit TestingRadiation Effects in ElectronicsIntegrated Circuits and Semiconductor Failure AnalysisSoftware Testing and Debugging TechniquesEmbedded Systems Design Techniques

数据来源: OpenAlex + ORCID + Wikidata · 数据质量: verified

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